NXP Semiconductors and Rohde & Schwarz collaborated to demonstrate a test setup for UWB radar target simulation at the Mobile World Congress.
The demonstration verified the performance of the NXP Trimension NCJ29D6A chipset with enhanced radar algorithms.
The test setup enables maximum control and reproducibility of simulated scenarios, with the capability to generate UWB radar targets at various distances.
The collaboration aims to support UWB technology in automotive use cases and reduce development cycles for UWB radar systems and algorithms.