<ul data-eligibleForWebStory="true"><li>New Imaging Technologies launches LiSaSWIR, a short-wave infrared line-by-line scanning camera for silicon PV inspection.</li><li>LiSaSWIR features a resolution of 2048 x 1 pixel, 8µm pixel pitch, and a frame rate of over 80kHz full frame.</li><li>The camera has a spectral response range of 9 μm to 1.7 μm and low read-out noise of 90e-.</li><li>Based on an InGaAs line scan array sensor, LiSaSWIR aims to provide high-definition and high-performance inspection solutions at an affordable price point.</li><li>The camera's speed and sensitivity enhance production efficiency according to the manufacturer.</li><li>The compact camera is designed for integration into industrial inspection systems and is compatible with GenICam and GenCP.</li><li>Features of the LiSaSWIR include low cost-per-pixel, best-in-class readout noise, ultra-short integration times, and high operational speed.</li></ul>

New SWIR line-scan camera for silicon PV quality control

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