<ul><li>Dr. Ming Zhang discussed the new frontier of AI for semiconductor testing at the TestConX 2025 conference, emphasizing the importance of investing in AI for enhancing processes and staying competitive.</li><li>Challenges related to data complexity, model adaptability, and security persist in integrating AI into semiconductor testing, but advancements in AI modeling and adaptive testing strategies offer promising solutions.</li><li>The deployment of AI in semiconductor testing requires addressing challenges like heterogeneous data, model maintenance, different deployment constraints, and security sensitivity.</li><li>Opportunities for AI in semiconductor testing include adaptive testing, predictive binning, burn-in reduction, connected data systems, and real-time monitoring, enhancing efficiency and quality across various testing applications.</li></ul>

AI For Test: The New Frontier

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