Machine learning models are increasingly used for automated decision-making, requiring early detection of concept drift for optimal performance.
Current research on concept drift mainly focuses on supervised tasks with immediate access to true labels, posing challenges for large datasets without instant labels.
A new algorithm utilizing statistical process control in a label-less setting is proposed for efficient concept drift detection with improved statistical power.
Introduction of a novel drift detection framework enhances the algorithm's performance in detecting drift without labels, as demonstrated through numerical simulations.