As a process integration engineer, identifying yield enhancement opportunities involved analyzing relationships between bin failures and process parameters within the fab.
Challenges included integrating various data types like sort maps, electrical test maps, parametric data, in-line metrology, and defect scans.
Efficiency in analyzing quality excursions is crucial due to the impact on tool utilization and fab shipments.
Synopsys' Decision Support System (DSS) efficiently analyzes diverse data sources stored in a data lakehouse, identifying latent relationships among different data types.
DSS provides ranked lists of data behaviors, prioritizing higher-correlating data that could be of interest to users.
The value of DSS lies in correlating map patterns and identifying relationships between different data parameters in the semiconductor industry.
DSS handles large data volumes, facilitating quick analysis and reducing manual work during investigations.
The Subscription feature in DSS notifies users of new data models or behaviors based on their set keywords, aiding in timely insights.
Increasing complexity in semiconductor fabs necessitates advanced data management approaches, making autonomous data analytics crucial for fab engineers.
The Decision Support System by Synopsys enhances fab engineering efficiency by identifying latent behaviors, correlating data, and presenting results effectively.