STOOD-X is a two-stage methodology for Out-of-Distribution (OOD) detection in machine learning.
The first stage of STOOD-X uses feature-space distances and a nonparametric test (Wilcoxon-Mann-Whitney) to identify OOD samples without assuming a specific feature distribution.
The second stage of STOOD-X generates user-friendly, concept-based visual explanations to reveal the features driving each decision.
STOOD-X achieves competitive performance in high-dimensional and complex settings and enhances human oversight, bias detection, and model debugging.